PCB
Accurate Test Fixture Characterization and Deembedding
For measurements of non-connectorized devices, test fixtures, probes or other structures are used to...
IoT Opportunity Demands New Approach to MCU-based Embedded Designs
Let's face it – the opportunity the IoT market offers is an unprecedented opportunity. The numbers...
From Prototype to Post Deployment: Linux Decision Points
Developing embedded solutions can be a journey. Not all applications start at the same place in the journey...
Temperature Considerations for Industrial Embedded SSDs
This white paper discusses the affects that extended high temperatures have on SSDs. It discusses endurance...
Solid-State Drives in Embedded Systems
Typical rotating media is perceived to be among the most significant causes of machine downtime in industrial...
Enabling Secure IoT Gateways with Embedded Operating Systems
The shift from a physical to digital world has been enabled by the IoT with a promise to bring a better,...
System Level Verification and Debug of DDR3/4 Memory Designs
This application note provides an introduction to the DDR memory technology and explains common challenges,...
Skyworks De-embedded Scattering Parameters
An integral part of modern RF/microwave circuit design is circuit simulation and evaluation in which...
Advanced Probing In DDR3/DDR4 Memory Designs
For reliable and efficient system verification and debug of DDR3/DDR4 memory designs, comprehensive compliance...
Is Your Electronics Supply Chain Risk Blind or Risk Resilient?
The semiconductor shortage has hindered production across industries, including the home appliance and...
Components and Methods for Current Measurement
Current sensing is used to perform two essential circuit functions. First, it is used to measure “how...
Thermal Management for Surface-Mount Devices
The origins of the ambient derating curve go back decades to when the U.S. military specified the performance...
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